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4D-STEM TESCAN TENSOR Materials Science Phase mapping Electron Microscopy Material Science Material characterization Orientation Analysis Transmission electron microscopy (TEM) energy storage 3DED 4D-STEM Analysis ACOM-TEM Advanced Microscopy Techniques BGO BLOGPOST Battery research Cathode stability Ceramics Compositional analysis Crystallographic Analysis EDS elemental mapping EDX Electron Detectors Electron Microscopy Innovations Eucentric height High-resolution imaging Lithium-ion batteries Materials Science Research Metallurgy Microscopy Microstructural analysis Nanomaterials Nanoscale Imaging Ni-rich cathode materials Orientation maps Phase Analysis Polycrystalline materials Precession Precession-assisted 4D-STEM STEM STEM Instrumentation STEM TECHNOLOGY STEM diffraction STEM imaging Scanning Transmission Electron Microscopy Semiconductor Industry Semiconductors Specimen Thickness Strain Mapping Strain analysis TEM TEM instruments Tescan Tensor STEM Thermoelectric Ceramics aluminum automated alignments automated microscopy diffraction pattern electron diffraction materials characterization microscopy automation nanobeam electron diffraction (NBED) nanotechnology piezo stage precession electron diffraction (PED) semiconductor devices strain measurement zone axis alignment

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只是一些来自 MMC 2023 的照片。下周在明尼阿波利斯举行的 M&M 2023 上见！

两周前，我们在曼彻斯特度过了一段难忘的时光！由英国皇家显微镜学会每两年举办一次的 MMC 2023 超出了我们的预期，证明它不仅仅是 "英国的事情"。我们的展位熙熙攘攘，参观者来自...

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