EMC European Microscopy
Congress 2024
Copenhagen, Denmark , from August 25 till 30, 2024
TESCAN at EMC 2024: Launch of TESCAN AMBER X 2
Visit TESCAN Booth #B9 where you can explore a variety of our latest innovations
The TESCAN Global Team is thrilled to announce our participation at the European Microscopy Congress (EMC) 2024 in Copenhagen, Denmark, from August 25 to 30. We look forward to connecting with you at this premier event and sharing our latest advancements in microscopy.
Launch of TESCAN AMBER X 2
We are particularly excited to unveil the TESCAN AMBER X 2, our newest plasma FIB-SEM system, at EMC 2024. Join us for a live demonstration of this groundbreaking technology and discover how it can elevate your research in materials science.
Key Features of TESCAN AMBER X 2
- Enhanced Plasma FIB Column: Experience superior profiles with optimized beam parameters, improving resolution, navigation, and milling performance.
- Field-Free SEM Column: Achieve high-resolution imaging of diverse materials without the limitations of immersion optics, offering a wide field of view and various scanning modes.
- Multimodal and Multiscale Analysis: Utilize unique 3D methods like real-time 3D ToF-SIMS for detailed elemental composition analysis, crucial for next-generation battery research.
Book your demo spot on TESCAN AMBER X 2!
Don’t miss this opportunity to witness the forefront of microscopy technology. Book a live demo of TESCAN AMBER X 2 at our booth and experience the cutting-edge advancements firsthand.
TENSOR 4D-STEM
Experience the capabilities of the TENSOR 4D-STEM, designed for multimodal nano-characterization. This technology excels in morphological, chemical, and structural analysis, making it essential for materials scientists, semiconductor R&D, failure analysis engineers, and crystallographers.
Book your demo spot for TENSOR!
New Generation TESCAN CLARA UHR SEM
Discover the CLARA UHR SEM’s fast, accurate, and comprehensive nanoscale surface analysis across a wide range of materials. See firsthand how it can bring new insights into your samples. Take an opportunity to discuss your needs with our expert or visit our website.
TESCAN UniTOM HR
Be amazed by the UniTOM HR, a versatile micro-CT system that combines high spatial resolution with impressive temporal resolution, suitable for both static and dynamic imaging. This state-of-the-art equipment meets all your microscopy imaging needs.
Book your demo spot for UniTOM HR!
Battery Research Analytical Workflow
Explore our optimized FIB-SEM solution for lithium-ion battery characterization. Learn how the combination of high-current FIB, field-free UHR SEM, and integrated ToF-SIMS can advance your battery research.
Life Sciences Innovations
Engage with our Life Sciences experts to discuss 2D and 3D characterization of biological samples. Learn about plasma FIB for overcoming Cryo-ET sample preparation bottlenecks, and ultra-fast cryo on-grid lamella preparation and lift-out from challenging samples.
We eagerly await your visit to our booth #B9 at EMC 2024. Let’s connect and explore the future of microscopy together!
TESCAN TENSOR
Experience an exclusive TENSOR demo. The first near-UHV 4D-STEM for multimodal nano-characterization.
TESCAN TENSOR
For demo bookings please contact our booth reception. We will try to accommodate your needs.
TESCAN AMBER X 2 - NEW!
Check out our new product Versatile nanoanalytical FIB-SEM with Gentle Ion Beam.
AMBER X 2 MISTRAL COLUMN – NEW!
For demo bookings please contact our booth reception. We will try to accommodate your needs.
TESCAN MIRA G4
Explore TESCAN MIRA at GATAN booth no. B11 This system provides an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
MIRA G4
For demo bookings please contact our booth reception. We will try to accommodate your needs.
TESCAN UniTOM HR
Micro-CT with sub-micron resolution and dynamic imaging capabilities, it offers unprecedented insights into your samples. Experience the future of 3D imaging firsthand – register for your demo today!
MicroCT UniTOM HR
For demo bookings please contact our booth reception. We will try to accommodate your needs.
Scientific talk
A cryo workflow combining light, electron and soft x-ray microscopy provides targeting of unlabeled features
Author: Jakub Javůrek
Micro CT
Registration form
Scientific talk (customer story)
Hyperspectral CT allows for non-destructive elemental imaging in museum specimen
Co-author: Michiel Krols, TESCAN XRE
Micro CT
Registration form
Poster session
ExpertPI: A Comprehensive Tool for Automated 4D-STEM Multimodal Analysis and Method Development
Author: Daniel Němeček
Micro CT
Registration form
Poster session
Leveraging FIB-SEM with Integrated ToF-SIMS for Comprehensive Characterization of Lithium-Ion Battery Materials
Author: Tomáš Šamořil
Micro CT
Registration form
Poster session
Leveraging FIB-SEM with Integrated ToF-SIMS for Comprehensive Characterization of Lithium-Ion Battery Materials
Author: Tomáš Šamořil
Micro CT
Registration form
Lunch Company Workshop
New Generation FIB-SEMs for Speed, Utility, Precision
Micro CT
Registration form
Flash presentation
Micro CT
Registration form
Where to meet
Bella Center Copenhagen
Center Blvd. 5,
2300 København,
Denmark