TENSOR 技术动态频道 

紧跟 TESCAN TENSOR 的最新资讯，涵盖用户案例、前沿应用和 STEM 技术的进步。加入我们，体验首款集成的、旋进辅助的分析型4D-STEM系统！

按标签筛选所有帖子
4D-STEM TESCAN TENSOR Materials Science Phase mapping Electron Microscopy Material Science Material characterization Orientation Analysis Transmission electron microscopy (TEM) energy storage 3DED 4D-STEM Analysis ACOM-TEM Advanced Microscopy Techniques BGO BLOGPOST Battery research Cathode stability Ceramics Compositional analysis Crystallographic Analysis EDS elemental mapping EDX Electron Detectors Electron Microscopy Innovations Eucentric height High-resolution imaging Lithium-ion batteries Materials Science Research Metallurgy Microscopy Microstructural analysis Nanomaterials Nanoscale Imaging Ni-rich cathode materials Orientation maps Phase Analysis Polycrystalline materials Precession Precession-assisted 4D-STEM STEM STEM Instrumentation STEM TECHNOLOGY STEM diffraction STEM imaging Scanning Transmission Electron Microscopy Semiconductor Industry Semiconductors Specimen Thickness Strain Mapping Strain analysis TEM TEM instruments Tescan Tensor STEM Thermoelectric Ceramics aluminum automated alignments automated microscopy diffraction pattern electron diffraction materials characterization microscopy automation nanobeam electron diffraction (NBED) nanotechnology piezo stage precession electron diffraction (PED) semiconductor devices strain measurement zone axis alignment

按日期筛选所有帖子

旧到新新到旧
注册接收最新文章
材料科学 电子探测器 半导体工业 纳米级成像 扫描透射电子显微镜 4D-STEM 分析 样品厚度 STEM 仪器

STEM 成像和 4D-STEM 分析的厚度限制

我们的最新技术报告探讨了现代 STEM 仪器对较厚样品进行成像和分析的能力。与我们一起揭示样品厚度对在 100 kV 下灵敏直接电子显微镜采集的数据质量的影响。

阅读全文...

有疑问？


想要在线演示？


我们的全球团队随时准备回答有关 TESCAN TENSOR 和 TESCAN 其他解决方案的问题。