TENSOR 技术动态频道 

紧跟 TESCAN TENSOR 的最新资讯，涵盖用户案例、前沿应用和 STEM 技术的进步。加入我们，体验首款集成的、旋进辅助的分析型4D-STEM系统！

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4D-STEM TESCAN TENSOR Materials Science Phase mapping Electron Microscopy Material Science Material characterization Orientation Analysis Transmission electron microscopy (TEM) energy storage 3DED 4D-STEM Analysis ACOM-TEM Advanced Microscopy Techniques BGO BLOGPOST Battery research Cathode stability Ceramics Compositional analysis Crystallographic Analysis EDS elemental mapping EDX Electron Detectors Electron Microscopy Innovations Eucentric height High-resolution imaging Lithium-ion batteries Materials Science Research Metallurgy Microscopy Microstructural analysis Nanomaterials Nanoscale Imaging Ni-rich cathode materials Orientation maps Phase Analysis Polycrystalline materials Precession Precession-assisted 4D-STEM STEM STEM Instrumentation STEM TECHNOLOGY STEM diffraction STEM imaging Scanning Transmission Electron Microscopy Semiconductor Industry Semiconductors Specimen Thickness Strain Mapping Strain analysis TEM TEM instruments Tescan Tensor STEM Thermoelectric Ceramics aluminum automated alignments automated microscopy diffraction pattern electron diffraction materials characterization microscopy automation nanobeam electron diffraction (NBED) nanotechnology piezo stage precession electron diffraction (PED) semiconductor devices strain measurement zone axis alignment

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半导体 4D-STEM 电子显微镜 材料表征 相图绘制 多晶材料 陶瓷 电离显微镜 冶金学

TENSOR | 精准清晰地揭开纳米世界的神秘面纱 

TESCAN GROUP隆重推出纳米分析领域的一项突破：在我们的TESCAN TENSOR 上将旋进辅助 4D-STEM 相位和方位映射与同步 EDX 信号集成在一起。这一创新方法由我们的专家率先提出，...

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